Common-path digital holography microscopy of buried semiconductor specimen
N.C. Gerhardt, M.R. Hofmann, M. Finkeldey, L. Göring, in: 2016.
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Gerhardt, Nils ChristopherLibreCat 
;
Hofmann, Martin R.;
Finkeldey, Markus;
Göring, Lena
;
Hofmann, Martin R.;
Finkeldey, Markus;
Göring, LenaPublishing Year
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Gerhardt NC, Hofmann MR, Finkeldey M, Göring L. Common-path digital holography microscopy of buried semiconductor specimen. In: ; 2016. doi:10.1364/aio.2016.jw4a.40
Gerhardt, N. C., Hofmann, M. R., Finkeldey, M., & Göring, L. (2016). Common-path digital holography microscopy of buried semiconductor specimen. https://doi.org/10.1364/aio.2016.jw4a.40
@inproceedings{Gerhardt_Hofmann_Finkeldey_Göring_2016, title={Common-path digital holography microscopy of buried semiconductor specimen}, DOI={10.1364/aio.2016.jw4a.40}, author={Gerhardt, Nils Christopher and Hofmann, Martin R. and Finkeldey, Markus and Göring, Lena}, year={2016} }
Gerhardt, Nils Christopher, Martin R. Hofmann, Markus Finkeldey, and Lena Göring. “Common-Path Digital Holography Microscopy of Buried Semiconductor Specimen,” 2016. https://doi.org/10.1364/aio.2016.jw4a.40.
N. C. Gerhardt, M. R. Hofmann, M. Finkeldey, and L. Göring, “Common-path digital holography microscopy of buried semiconductor specimen,” 2016, doi: 10.1364/aio.2016.jw4a.40.
Gerhardt, Nils Christopher, et al. Common-Path Digital Holography Microscopy of Buried Semiconductor Specimen. 2016, doi:10.1364/aio.2016.jw4a.40.
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