Split'n Trace NVM: Leveraging Library OSes for Semantic Memory Tracing

C. Hakert, K.-H. Chen, S. Kuenzer, S. Santhanam, S.-H. Chen, Y.-H. Chang, F. Huici, J.-J. Chen, in: 2020 9th Non-Volatile Memory Systems and Applications Symposium (NVMSA), IEEE, 2020.

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Hakert, Christian; Chen, Kuan-Hsun; Kuenzer, Simon; Santhanam, Sharan; Chen, Shuo-Han; Chang, Yuan-Hao; Huici, Felipe; Chen, Jian-Jia
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2020 9th Non-Volatile Memory Systems and Applications Symposium (NVMSA)
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Hakert C, Chen K-H, Kuenzer S, et al. Split’n Trace NVM: Leveraging Library OSes for Semantic Memory Tracing. In: 2020 9th Non-Volatile Memory Systems and Applications Symposium (NVMSA). IEEE; 2020. doi:10.1109/nvmsa51238.2020.9188136
Hakert, C., Chen, K.-H., Kuenzer, S., Santhanam, S., Chen, S.-H., Chang, Y.-H., Huici, F., & Chen, J.-J. (2020). Split’n Trace NVM: Leveraging Library OSes for Semantic Memory Tracing. 2020 9th Non-Volatile Memory Systems and Applications Symposium (NVMSA). https://doi.org/10.1109/nvmsa51238.2020.9188136
@inproceedings{Hakert_Chen_Kuenzer_Santhanam_Chen_Chang_Huici_Chen_2020, title={Split’n Trace NVM: Leveraging Library OSes for Semantic Memory Tracing}, DOI={10.1109/nvmsa51238.2020.9188136}, booktitle={2020 9th Non-Volatile Memory Systems and Applications Symposium (NVMSA)}, publisher={IEEE}, author={Hakert, Christian and Chen, Kuan-Hsun and Kuenzer, Simon and Santhanam, Sharan and Chen, Shuo-Han and Chang, Yuan-Hao and Huici, Felipe and Chen, Jian-Jia}, year={2020} }
Hakert, Christian, Kuan-Hsun Chen, Simon Kuenzer, Sharan Santhanam, Shuo-Han Chen, Yuan-Hao Chang, Felipe Huici, and Jian-Jia Chen. “Split’n Trace NVM: Leveraging Library OSes for Semantic Memory Tracing.” In 2020 9th Non-Volatile Memory Systems and Applications Symposium (NVMSA). IEEE, 2020. https://doi.org/10.1109/nvmsa51238.2020.9188136.
C. Hakert et al., “Split’n Trace NVM: Leveraging Library OSes for Semantic Memory Tracing,” 2020, doi: 10.1109/nvmsa51238.2020.9188136.
Hakert, Christian, et al. “Split’n Trace NVM: Leveraging Library OSes for Semantic Memory Tracing.” 2020 9th Non-Volatile Memory Systems and Applications Symposium (NVMSA), IEEE, 2020, doi:10.1109/nvmsa51238.2020.9188136.

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