Evidences of defect contribution in magnetically ordered Sm-implanted GaN

F.-Y. Lo, J.-Y. Guo, C.-D. Huang, K.-C. Chou, H.-L. Liu, V. Ney, A. Ney, M.-Y. Chern, S. Shvarkov, D. Reuter, A.D. Wieck, S. Pezzagna, J. Massies, Current Applied Physics 14 (2013) S7–S11.

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Journal Article | Published | English
Author
Lo, Fang-Yuh; Guo, Jhong-Yu; Huang, Cheng-De; Chou, Kai-Chieh; Liu, Hsiang-Lin; Ney, Verena; Ney, Andreas; Chern, Ming-Yau; Shvarkov, Stepan; Reuter, DirkLibreCat; Wieck, Andreas D.; Pezzagna, Sébastien
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Journal Title
Current Applied Physics
Volume
14
Page
S7-S11
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Lo F-Y, Guo J-Y, Huang C-D, et al. Evidences of defect contribution in magnetically ordered Sm-implanted GaN. Current Applied Physics. 2013;14:S7-S11. doi:10.1016/j.cap.2013.11.051
Lo, F.-Y., Guo, J.-Y., Huang, C.-D., Chou, K.-C., Liu, H.-L., Ney, V., … Massies, J. (2013). Evidences of defect contribution in magnetically ordered Sm-implanted GaN. Current Applied Physics, 14, S7–S11. https://doi.org/10.1016/j.cap.2013.11.051
@article{Lo_Guo_Huang_Chou_Liu_Ney_Ney_Chern_Shvarkov_Reuter_et al._2013, title={Evidences of defect contribution in magnetically ordered Sm-implanted GaN}, volume={14}, DOI={10.1016/j.cap.2013.11.051}, journal={Current Applied Physics}, publisher={Elsevier BV}, author={Lo, Fang-Yuh and Guo, Jhong-Yu and Huang, Cheng-De and Chou, Kai-Chieh and Liu, Hsiang-Lin and Ney, Verena and Ney, Andreas and Chern, Ming-Yau and Shvarkov, Stepan and Reuter, Dirk and et al.}, year={2013}, pages={S7–S11} }
Lo, Fang-Yuh, Jhong-Yu Guo, Cheng-De Huang, Kai-Chieh Chou, Hsiang-Lin Liu, Verena Ney, Andreas Ney, et al. “Evidences of Defect Contribution in Magnetically Ordered Sm-Implanted GaN.” Current Applied Physics 14 (2013): S7–11. https://doi.org/10.1016/j.cap.2013.11.051.
F.-Y. Lo et al., “Evidences of defect contribution in magnetically ordered Sm-implanted GaN,” Current Applied Physics, vol. 14, pp. S7–S11, 2013.
Lo, Fang-Yuh, et al. “Evidences of Defect Contribution in Magnetically Ordered Sm-Implanted GaN.” Current Applied Physics, vol. 14, Elsevier BV, 2013, pp. S7–11, doi:10.1016/j.cap.2013.11.051.

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