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1998 | Journal Article | LibreCat-ID: 7694
R. D. Tscheuschner, S. Hoch, E. Leschinsky, C. Meier, S. Theis, and A. D. Wieck, “Robustness of the Quantum Hall Effect, Sample Size Versus Sample Topology, and Quality Control Management of III–V Molecular Beam Epitaxy,” International Journal of Modern Physics B, vol. 12, no. 11, pp. 1147–1170, 1998.
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