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151 Publications


1999 | Book | LibreCat-ID: 13065
S. Hellebrand, Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren. Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg, 1999.
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1999 | Misc | LibreCat-ID: 13093
S. Hellebrand, H.-J. Wunderlich, and V. N. Yarmolik, Exploiting Symmetries to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop, 1999.
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1999 | Conference Paper | LibreCat-ID: 13006
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N. Yarmolik, “Error Detecting Refreshment for Embedded DRAMs,” in 17th IEEE VLSI Test Symposium (VTS’99), 1999, pp. 384–390, doi: 10.1109/vtest.1999.766693.
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1999 | Conference Paper | LibreCat-ID: 13066
V. N. Yarmolik, I. V. Bykov, S. Hellebrand, and H.-J. Wunderlich, “Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms,” 1999.
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1999 | Conference Paper | LibreCat-ID: 13067
S. Hellebrand, H.-J. Wunderlich, and V. N. Yarmolik, “Symmetric Transparent BIST for RAMs,” in Design Automation and Test in Europe (DATE’99), 1999, pp. 702–707.
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1998 | Report | LibreCat-ID: 13029
S. Hellebrand and H.-J. Wunderlich, Test und Synthese schneller eingebetteter Systeme. Universität Stuttgart, 1998.
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1998 | Misc | LibreCat-ID: 13091
V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.
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1998 | Misc | LibreCat-ID: 13092
V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories. 10th GI/ITG/GMM/IEEE Workshop, 1998.
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1998 | Book Chapter | LibreCat-ID: 13060
S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, “Mixed-Mode BIST Using Embedded Processors,” in Mixed-Mode BIST Using Embedded Processors, In: M. Nicolaidis, Y. Zorian, D. K. Pradhan (Eds.): On-Line Testing for VLSI, Boston: Kluwer Academic Publishers 1998: Kluwer Academic Publishers, 1998.
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1998 | Journal Article | LibreCat-ID: 13061
S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, “Mixed-Mode BIST Using Embedded Processors,” Journal of Electronic Testing Theory and Applications - JETTA, vol. 12, no. 1/2, pp. 127–138, 1998.
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