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66 Publications


2013 | Journal Article | LibreCat-ID: 23643
Oxygen diffusivity in silicon derived from dynamical X-ray diffraction
J. Will, A. Gröschel, D. Kot, M.A. Schubert, C. Bergmann, H.-G. Steinrück, G. Kissinger, A. Magerl, Journal of Applied Physics 7 (2013) 073508.
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