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1 Publication
2019 | Journal Article | LibreCat-ID: 13048
Kampmann, M., A. Kochte, M., Liu, C., Schneider, E., Hellebrand, S., & Wunderlich, H.-J. (2019). Built-in Test for Hidden Delay Faults. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 38(10), 1956–1968.
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