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1 Publication
2017 | Conference Paper | LibreCat-ID: 10576
Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test
M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.
LibreCat
| DOI
M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.