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1 Publication
2022 | Journal Article | LibreCat-ID: 29351
Stress-Aware Periodic Test of Interconnects
S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing (2022).
LibreCat
| DOI
S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing (2022).