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1 Publication
2022 | Journal Article | LibreCat-ID: 29351
Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Stress-Aware Periodic Test of Interconnects.” Journal of Electronic Testing, 2022. https://doi.org/10.1007/s10836-021-05979-5.
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