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1 Publication


2026 | Journal Article | LibreCat-ID: 67533
Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection
E.S. Cishugi, T.T. Smit, B. Forlin, C. Cazzaniga, K.-H. Chen, M. Ottavi, IEEE Transactions on Device and Materials Reliability 26 (2026) 752–760.
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