Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection

Cishugi, E. S., Smit, T. T., Forlin, B., Cazzaniga, C., Chen, K.-H., & Ottavi, M. (2026). Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection. IEEE Transactions on Device and Materials Reliability, 26(3), 752–760. https://doi.org/10.1109/tdmr.2026.3707731

@article{Cishugi_Smit_Forlin_Cazzaniga_Chen_Ottavi_2026, title={Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection}, volume={26}, DOI={10.1109/tdmr.2026.3707731}, number={3}, journal={IEEE Transactions on Device and Materials Reliability}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Cishugi, Elijah Seth and Smit, Tijmen T. and Forlin, Bruno and Cazzaniga, Carlo and Chen, Kuan-Hsun and Ottavi, Marco}, year={2026}, pages={752–760} }

Cishugi, Elijah Seth, Tijmen T. Smit, Bruno Forlin, Carlo Cazzaniga, Kuan-Hsun Chen, and Marco Ottavi. “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection.” IEEE Transactions on Device and Materials Reliability 26, no. 3 (2026): 752–60. https://doi.org/10.1109/tdmr.2026.3707731.

E. S. Cishugi, T. T. Smit, B. Forlin, C. Cazzaniga, K.-H. Chen, and M. Ottavi, “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection,” IEEE Transactions on Device and Materials Reliability, vol. 26, no. 3, pp. 752–760, 2026, doi: 10.1109/tdmr.2026.3707731.

Cishugi, Elijah Seth, et al. “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection.” IEEE Transactions on Device and Materials Reliability, vol. 26, no. 3, Institute of Electrical and Electronics Engineers (IEEE), 2026, pp. 752–60, doi:10.1109/tdmr.2026.3707731.