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1 Publication
2020 | Journal Article | LibreCat-ID: 23599
Savikhin, V., Steinrück, H.-G., Liang, R.-Z., Collins, B. A., Oosterhout, S. D., Beaujuge, P. M., & Toney, M. F. (2020). GIWAXS-SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials. Journal of Applied Crystallography, 53, 1108–1129. https://doi.org/10.1107/s1600576720005476
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