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782 Publications
2021 | Journal Article | LibreCat-ID: 24130
A. Magnier, T. Wu, S. R. Tinkloh, T. Tröster, B. Scholtes, and T. Niendorf, “On the reliability of residual stress measurements in unidirectional carbon fibre reinforced epoxy composites,” Polymer Testing, Art. no. 107146, 2021, doi: 10.1016/j.polymertesting.2021.107146.
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2020 | Journal Article | LibreCat-ID: 20233 |

V. Myroshnychenko, S. Smirnov, P. M. M. Jose, C. Brosseau, and J. Förstner, “Nonlinear dielectric properties of random paraelectric-dielectric composites,” Acta Materialia, vol. 203, p. 116432, 2020.
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2020 | Journal Article | LibreCat-ID: 21239
S. K. Sahoo, J. J. Heske, M. Antonietti, Q. Qin, M. Oschatz, and T. Kühne, “Electrochemical N2 Reduction to Ammonia Using Single Au/Fe Atoms Supported on Nitrogen-Doped Porous Carbon,” ACS Applied Energy Materials, vol. 3, no. 10, pp. 10061–10069, 2020.
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| DOI
2020 | Mastersthesis | LibreCat-ID: 21324
K. Chandrakar, Comparison of Feature Selection Techniques to Improve Approximate Circuit Synthesis. 2020.
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2020 | Conference Paper | LibreCat-ID: 21534
V. Bengs and E. Hüllermeier, “Preselection Bandits,” in International Conference on Machine Learning, 2020, pp. 778–787.
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2020 | Preprint | LibreCat-ID: 21536
V. Bengs and E. Hüllermeier, “Multi-Armed Bandits with Censored Consumption of Resources,” arXiv:2011.00813. 2020.
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2020 | Conference Paper | LibreCat-ID: 21541
S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, and U. Hilleringmann, “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000,” in 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy , 2020.
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2020 | Book Chapter | LibreCat-ID: 21542
D. Schröder, S. Lange, C. Hangmann, and C. Hedayat, “Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs,” in Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed., Croyton, UK: The Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32).
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