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489 Publications


2010 | Conference Paper | LibreCat-ID: 1022
Energy efficiency model of network-coded cooperation in wireless sensor networks
D.H. Woldegebreal, H. Karl, in: Sensor Technologies and Applications (SENSORCOMM), 2010 Fourth International Conference On, 2010, pp. 513--520.
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2010 | Book Chapter | LibreCat-ID: 10704
ReconOS: An Operating System for Dynamically Reconfigurable Hardware
E. Lübbers, M. Platzner, in: M. Platzner, J. Teich, N. Wehn (Eds.), Dynamically Reconfigurable Systems: Architectures, Design Methods and Applications, Springer-Verlag GmbH, 2010, pp. 269–290.
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2010 | Conference Paper | LibreCat-ID: 11726
Barometric height estimation combined with map-matching in a loosely-coupled Kalman-filter
M. Bevermeier, O. Walter, S. Peschke, R. Haeb-Umbach, in: 7th Workshop on Positioning Navigation and Communication (WPNC 2010), 2010, pp. 128–134.
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2010 | Journal Article | LibreCat-ID: 11846
Model-Based Feature Enhancement for Reverberant Speech Recognition
A. Krueger, R. Haeb-Umbach, IEEE Transactions on Audio, Speech, and Language Processing 18 (2010) 1692–1707.
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2010 | Conference Paper | LibreCat-ID: 11858 LibreCat | Download (ext.)
 

2010 | Journal Article | LibreCat-ID: 13171
Nucleate pool boiling, film boiling and single-phase free convection at pressures up to the critical state. Part I: Integral heat transfer for horizontal copper cylinders
D. Gorenflo, E. Baumhögger, T. Windmann, G. Herres, International Journal of Refrigeration (2010) 1229–1250.
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2010 | Conference Paper | LibreCat-ID: 12983
Variation-Aware Fault Modeling
F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: {19th IEEE Asian Test Symposium (ATS’10)}, {IEEE}, Shanghai, China, 2010, pp. 87–93.
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2010 | Conference Paper | LibreCat-ID: 12988
Reusing NoC-Infrastructure for Test Data Compression
V. Froese, R. Ibers, S. Hellebrand, in: {28th IEEE VLSI Test Symposium (VTS’10)}, {IEEE}, Santa Cruz, CA, USA, 2010, pp. 227–231.
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2010 | Journal Article | LibreCat-ID: 13260
The Use of Instant Messaging in Working Relationship Development: A Case Study
H.-K. Cho, M. Trier, E. Kim, Journal of Computer-Mediated Communication (2010) 00–00.
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2010 | Conference Paper | LibreCat-ID: 13049
Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: {4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}, Chicago, IL, USA, 2010.
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