Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias

V. Höink, M. Sacher, J. Schmalhorst, G. Reiss, D. Engel, D. Junk, A. Ehresmann, Applied Physics Letters 86 (2005).

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Journal Article | Published | English
Author
Höink, V.; Sacher, MarcLibreCat ; Schmalhorst, J.; Reiss, G.; Engel, D.; Junk, D.; Ehresmann, A.
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Publishing Year
Journal Title
Applied Physics Letters
Volume
86
Issue
15
Article Number
152102
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Höink V, Sacher M, Schmalhorst J, et al. Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias. Applied Physics Letters. 2005;86(15). doi:10.1063/1.1899771
Höink, V., Sacher, M., Schmalhorst, J., Reiss, G., Engel, D., Junk, D., & Ehresmann, A. (2005). Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias. Applied Physics Letters, 86(15), Article 152102. https://doi.org/10.1063/1.1899771
@article{Höink_Sacher_Schmalhorst_Reiss_Engel_Junk_Ehresmann_2005, title={Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias}, volume={86}, DOI={10.1063/1.1899771}, number={15152102}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Höink, V. and Sacher, Marc and Schmalhorst, J. and Reiss, G. and Engel, D. and Junk, D. and Ehresmann, A.}, year={2005} }
Höink, V., Marc Sacher, J. Schmalhorst, G. Reiss, D. Engel, D. Junk, and A. Ehresmann. “Postannealing of Magnetic Tunnel Junctions with Ion-Bombardment-Modified Exchange Bias.” Applied Physics Letters 86, no. 15 (2005). https://doi.org/10.1063/1.1899771.
V. Höink et al., “Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias,” Applied Physics Letters, vol. 86, no. 15, Art. no. 152102, 2005, doi: 10.1063/1.1899771.
Höink, V., et al. “Postannealing of Magnetic Tunnel Junctions with Ion-Bombardment-Modified Exchange Bias.” Applied Physics Letters, vol. 86, no. 15, 152102, AIP Publishing, 2005, doi:10.1063/1.1899771.

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