Fault modeling in controllable polarity silicon nanowire circuits

H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, G. De Micheli, in: Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition, EDA Consortium, 2015, pp. 453–458.

Download
No fulltext has been uploaded.
Conference Paper | English
Author
; ;
Publishing Year
Proceedings Title
Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition
Page
453-458
LibreCat-ID

Cite this

Ghasemzadeh Mohammadi H, Gaillardon P-E, De Micheli G. Fault modeling in controllable polarity silicon nanowire circuits. In: Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition. EDA Consortium; 2015:453-458. doi:10.7873/DATE.2015.0428
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., & De Micheli, G. (2015). Fault modeling in controllable polarity silicon nanowire circuits. In Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition (pp. 453–458). EDA Consortium. https://doi.org/10.7873/DATE.2015.0428
@inproceedings{Ghasemzadeh Mohammadi_Gaillardon_De Micheli_2015, title={Fault modeling in controllable polarity silicon nanowire circuits}, DOI={10.7873/DATE.2015.0428}, booktitle={Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition}, publisher={EDA Consortium}, author={Ghasemzadeh Mohammadi, Hassan and Gaillardon, Pierre-Emmanuel and De Micheli, Giovanni}, year={2015}, pages={453–458} }
Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, and Giovanni De Micheli. “Fault Modeling in Controllable Polarity Silicon Nanowire Circuits.” In Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition, 453–58. EDA Consortium, 2015. https://doi.org/10.7873/DATE.2015.0428.
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, and G. De Micheli, “Fault modeling in controllable polarity silicon nanowire circuits,” in Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition, 2015, pp. 453–458.
Ghasemzadeh Mohammadi, Hassan, et al. “Fault Modeling in Controllable Polarity Silicon Nanowire Circuits.” Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition, EDA Consortium, 2015, pp. 453–58, doi:10.7873/DATE.2015.0428.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar