A fast TCAD-based methodology for Variation analysis of emerging nano-devices
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, G. De Micheli, in: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), IEEE, 2013, pp. 83–88.
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Conference Paper
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Author
Ghasemzadeh Mohammadi, HassanLibreCat;
Gaillardon, Pierre-Emmanuel;
Yazdani, Majid;
De Micheli, Giovanni
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Publishing Year
Proceedings Title
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
Page
83-88
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Ghasemzadeh Mohammadi H, Gaillardon P-E, Yazdani M, De Micheli G. A fast TCAD-based methodology for Variation analysis of emerging nano-devices. In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS). IEEE; 2013:83-88. doi:10.1109/DFT.2013.6653587
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., Yazdani, M., & De Micheli, G. (2013). A fast TCAD-based methodology for Variation analysis of emerging nano-devices. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (pp. 83–88). IEEE. https://doi.org/10.1109/DFT.2013.6653587
@inproceedings{Ghasemzadeh Mohammadi_Gaillardon_Yazdani_De Micheli_2013, title={A fast TCAD-based methodology for Variation analysis of emerging nano-devices}, DOI={10.1109/DFT.2013.6653587}, booktitle={2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)}, publisher={IEEE}, author={Ghasemzadeh Mohammadi, Hassan and Gaillardon, Pierre-Emmanuel and Yazdani, Majid and De Micheli, Giovanni}, year={2013}, pages={83–88} }
Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, Majid Yazdani, and Giovanni De Micheli. “A Fast TCAD-Based Methodology for Variation Analysis of Emerging Nano-Devices.” In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 83–88. IEEE, 2013. https://doi.org/10.1109/DFT.2013.6653587.
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, and G. De Micheli, “A fast TCAD-based methodology for Variation analysis of emerging nano-devices,” in 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2013, pp. 83–88.
Ghasemzadeh Mohammadi, Hassan, et al. “A Fast TCAD-Based Methodology for Variation Analysis of Emerging Nano-Devices.” 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), IEEE, 2013, pp. 83–88, doi:10.1109/DFT.2013.6653587.
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