The Pseudo-Exhaustive Test of Sequential Circuits
H.-J. Wunderlich, S. Hellebrand, in: IEEE International Test Conference (ITC’89), IEEE, Washington, DC, USA, 1989, pp. 19–27.
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Wunderlich, Hans-Joachim;
Hellebrand, SybilleLibreCat 
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IEEE International Test Conference (ITC'89)
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19-27
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Wunderlich H-J, Hellebrand S. The Pseudo-Exhaustive Test of Sequential Circuits. In: IEEE International Test Conference (ITC’89). IEEE; 1989:19-27. doi:10.1109/test.1989.82273
Wunderlich, H.-J., & Hellebrand, S. (1989). The Pseudo-Exhaustive Test of Sequential Circuits. IEEE International Test Conference (ITC’89), 19–27. https://doi.org/10.1109/test.1989.82273
@inproceedings{Wunderlich_Hellebrand_1989, place={Washington, DC, USA}, title={The Pseudo-Exhaustive Test of Sequential Circuits}, DOI={10.1109/test.1989.82273}, booktitle={IEEE International Test Conference (ITC’89)}, publisher={IEEE}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1989}, pages={19–27} }
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test of Sequential Circuits.” In IEEE International Test Conference (ITC’89), 19–27. Washington, DC, USA: IEEE, 1989. https://doi.org/10.1109/test.1989.82273.
H.-J. Wunderlich and S. Hellebrand, “The Pseudo-Exhaustive Test of Sequential Circuits,” in IEEE International Test Conference (ITC’89), 1989, pp. 19–27, doi: 10.1109/test.1989.82273.
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test of Sequential Circuits.” IEEE International Test Conference (ITC’89), IEEE, 1989, pp. 19–27, doi:10.1109/test.1989.82273.
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