The Pseudo-Exhaustive Test of Sequential Circuits

H.-J. Wunderlich, S. Hellebrand, in: {IEEE International Test Conference (ITC’89)}, {IEEE (Comput. Soc. Press)}, Washington, DC, USA, 1989, pp. 19–27.

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{IEEE International Test Conference (ITC'89)}
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19-27
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Wunderlich H-J, Hellebrand S. The Pseudo-Exhaustive Test of Sequential Circuits. In: {IEEE International Test Conference (ITC’89)}. Washington, DC, USA: {IEEE (Comput. Soc. Press)}; 1989:19-27. doi:10.1109/test.1989.82273
Wunderlich, H.-J., & Hellebrand, S. (1989). The Pseudo-Exhaustive Test of Sequential Circuits. In {IEEE International Test Conference (ITC’89)} (pp. 19–27). Washington, DC, USA: {IEEE (Comput. Soc. Press)}. https://doi.org/10.1109/test.1989.82273
@inproceedings{Wunderlich_Hellebrand_1989, place={Washington, DC, USA}, title={The Pseudo-Exhaustive Test of Sequential Circuits}, DOI={10.1109/test.1989.82273}, booktitle={{IEEE International Test Conference (ITC’89)}}, publisher={{IEEE (Comput. Soc. Press)}}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1989}, pages={19–27} }
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test of Sequential Circuits.” In {IEEE International Test Conference (ITC’89)}, 19–27. Washington, DC, USA: {IEEE (Comput. Soc. Press)}, 1989. https://doi.org/10.1109/test.1989.82273.
H.-J. Wunderlich and S. Hellebrand, “The Pseudo-Exhaustive Test of Sequential Circuits,” in {IEEE International Test Conference (ITC’89)}, 1989, pp. 19–27.
Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test of Sequential Circuits.” {IEEE International Test Conference (ITC’89)}, {IEEE (Comput. Soc. Press)}, 1989, pp. 19–27, doi:10.1109/test.1989.82273.

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