A High Performance SEU Tolerant Latch

Z. Huang, H. Liang, S. Hellebrand, {Journal of Electronic Testing - Theory and Applications (JETTA)} 31 (2015) 349–359.

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Journal Article | English
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Publishing Year
Journal Title
{Journal of Electronic Testing - Theory and Applications (JETTA)}
Volume
31
Issue
4
Page
349-359
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Huang Z, Liang H, Hellebrand S. A High Performance SEU Tolerant Latch. {Journal of Electronic Testing - Theory and Applications (JETTA)}. 2015;31(4):349-359.
Huang, Z., Liang, H., & Hellebrand, S. (2015). A High Performance SEU Tolerant Latch. {Journal of Electronic Testing - Theory and Applications (JETTA)}, 31(4), 349–359.
@article{Huang_Liang_Hellebrand_2015, title={A High Performance SEU Tolerant Latch}, volume={31}, number={4}, journal={{Journal of Electronic Testing - Theory and Applications (JETTA)}}, author={Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille}, year={2015}, pages={349–359} }
Huang, Zhengfeng, Huaguo Liang, and Sybille Hellebrand. “A High Performance SEU Tolerant Latch.” {Journal of Electronic Testing - Theory and Applications (JETTA)} 31, no. 4 (2015): 349–59.
Z. Huang, H. Liang, and S. Hellebrand, “A High Performance SEU Tolerant Latch,” {Journal of Electronic Testing - Theory and Applications (JETTA)}, vol. 31, no. 4, pp. 349–359, 2015.
Huang, Zhengfeng, et al. “A High Performance SEU Tolerant Latch.” {Journal of Electronic Testing - Theory and Applications (JETTA)}, vol. 31, no. 4, 2015, pp. 349–59.

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