Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection
K. Seino, W.G. Schmidt, F. Bechstedt, Physical Review Letters 93 (2004).
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| English
Author
Seino, K.;
Schmidt, Wolf GeroLibreCat 
;
Bechstedt, F.
;
Bechstedt, F.Department
Publishing Year
Journal Title
Physical Review Letters
Volume
93
Issue
3
Financial disclosure
Article Processing Charge funded by the Deutsche Forschungsgemeinschaft.
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Seino K, Schmidt WG, Bechstedt F. Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection. Physical Review Letters. 2004;93(3). doi:10.1103/physrevlett.93.036101
Seino, K., Schmidt, W. G., & Bechstedt, F. (2004). Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection. Physical Review Letters, 93(3). https://doi.org/10.1103/physrevlett.93.036101
@article{Seino_Schmidt_Bechstedt_2004, title={Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection}, volume={93}, DOI={10.1103/physrevlett.93.036101}, number={3}, journal={Physical Review Letters}, author={Seino, K. and Schmidt, Wolf Gero and Bechstedt, F.}, year={2004} }
Seino, K., Wolf Gero Schmidt, and F. Bechstedt. “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection.” Physical Review Letters 93, no. 3 (2004). https://doi.org/10.1103/physrevlett.93.036101.
K. Seino, W. G. Schmidt, and F. Bechstedt, “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection,” Physical Review Letters, vol. 93, no. 3, 2004, doi: 10.1103/physrevlett.93.036101.
Seino, K., et al. “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection.” Physical Review Letters, vol. 93, no. 3, 2004, doi:10.1103/physrevlett.93.036101.
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