Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection

K. Seino, W.G. Schmidt, F. Bechstedt, Physical Review Letters 93 (2004).

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Journal Article | Published | English
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Physical Review Letters
Volume
93
Issue
3
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Article Processing Charge funded by the Deutsche Forschungsgemeinschaft and the Open Access Publication Fund of LibreCat University.
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Seino K, Schmidt WG, Bechstedt F. Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection. Physical Review Letters. 2004;93(3). doi:10.1103/physrevlett.93.036101
Seino, K., Schmidt, W. G., & Bechstedt, F. (2004). Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection. Physical Review Letters, 93(3). https://doi.org/10.1103/physrevlett.93.036101
@article{Seino_Schmidt_Bechstedt_2004, title={Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection}, volume={93}, DOI={10.1103/physrevlett.93.036101}, number={3}, journal={Physical Review Letters}, author={Seino, K. and Schmidt, Wolf Gero and Bechstedt, F.}, year={2004} }
Seino, K., Wolf Gero Schmidt, and F. Bechstedt. “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection.” Physical Review Letters 93, no. 3 (2004). https://doi.org/10.1103/physrevlett.93.036101.
K. Seino, W. G. Schmidt, and F. Bechstedt, “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection,” Physical Review Letters, vol. 93, no. 3, 2004.
Seino, K., et al. “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection.” Physical Review Letters, vol. 93, no. 3, 2004, doi:10.1103/physrevlett.93.036101.

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