Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection
K. Seino, W.G. Schmidt, F. Bechstedt, Physical Review Letters 93 (2004).
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Journal Article
| Published
| English
Author
Seino, K.;
Schmidt, Wolf GeroLibreCat 
;
Bechstedt, F.
;
Bechstedt, F.Publishing Year
Journal Title
Physical Review Letters
Volume
93
Issue
3
Financial disclosure
Article Processing Charge funded by the Deutsche Forschungsgemeinschaft.
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Cite this
Seino K, Schmidt WG, Bechstedt F. Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection. Physical Review Letters. 2004;93(3). doi:10.1103/physrevlett.93.036101
Seino, K., Schmidt, W. G., & Bechstedt, F. (2004). Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection. Physical Review Letters, 93(3). https://doi.org/10.1103/physrevlett.93.036101
@article{Seino_Schmidt_Bechstedt_2004, title={Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection}, volume={93}, DOI={10.1103/physrevlett.93.036101}, number={3}, journal={Physical Review Letters}, author={Seino, K. and Schmidt, Wolf Gero and Bechstedt, F.}, year={2004} }
Seino, K., Wolf Gero Schmidt, and F. Bechstedt. “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection.” Physical Review Letters 93, no. 3 (2004). https://doi.org/10.1103/physrevlett.93.036101.
K. Seino, W. G. Schmidt, and F. Bechstedt, “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection,” Physical Review Letters, vol. 93, no. 3, 2004.
Seino, K., et al. “Energetics of Si(001) Surfaces Exposed to Electric Fields and Charge Injection.” Physical Review Letters, vol. 93, no. 3, 2004, doi:10.1103/physrevlett.93.036101.
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