Calculation of surface optical properties: from qualitative understanding to quantitative predictions
W.G. Schmidt, K. Seino, P.H. Hahn, F. Bechstedt, W. Lu, S. Wang, J. Bernholc, Thin Solid Films 455–456 (2004) 764–771.
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Journal Article
| Published
| English
Author
Schmidt, Wolf GeroLibreCat 
;
Seino, K.;
Hahn, P.H.;
Bechstedt, F.;
Lu, W.;
Wang, S.;
Bernholc, J.
;
Seino, K.;
Hahn, P.H.;
Bechstedt, F.;
Lu, W.;
Wang, S.;
Bernholc, J.Publishing Year
Journal Title
Thin Solid Films
Volume
455-456
Page
764-771
ISSN
LibreCat-ID
Cite this
Schmidt WG, Seino K, Hahn PH, et al. Calculation of surface optical properties: from qualitative understanding to quantitative predictions. Thin Solid Films. 2004;455-456:764-771. doi:10.1016/j.tsf.2003.11.263
Schmidt, W. G., Seino, K., Hahn, P. H., Bechstedt, F., Lu, W., Wang, S., & Bernholc, J. (2004). Calculation of surface optical properties: from qualitative understanding to quantitative predictions. Thin Solid Films, 455–456, 764–771. https://doi.org/10.1016/j.tsf.2003.11.263
@article{Schmidt_Seino_Hahn_Bechstedt_Lu_Wang_Bernholc_2004, title={Calculation of surface optical properties: from qualitative understanding to quantitative predictions}, volume={455–456}, DOI={10.1016/j.tsf.2003.11.263}, journal={Thin Solid Films}, author={Schmidt, Wolf Gero and Seino, K. and Hahn, P.H. and Bechstedt, F. and Lu, W. and Wang, S. and Bernholc, J.}, year={2004}, pages={764–771} }
Schmidt, Wolf Gero, K. Seino, P.H. Hahn, F. Bechstedt, W. Lu, S. Wang, and J. Bernholc. “Calculation of Surface Optical Properties: From Qualitative Understanding to Quantitative Predictions.” Thin Solid Films 455–456 (2004): 764–71. https://doi.org/10.1016/j.tsf.2003.11.263.
W. G. Schmidt et al., “Calculation of surface optical properties: from qualitative understanding to quantitative predictions,” Thin Solid Films, vol. 455–456, pp. 764–771, 2004.
Schmidt, Wolf Gero, et al. “Calculation of Surface Optical Properties: From Qualitative Understanding to Quantitative Predictions.” Thin Solid Films, vol. 455–456, 2004, pp. 764–71, doi:10.1016/j.tsf.2003.11.263.
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