Layer-by-layer analysis of surface reflectance anisotropy in semiconductors

C. Castillo, B.S. Mendoza, W.G. Schmidt, P.H. Hahn, F. Bechstedt, Physical Review B 68 (2003) 041310(R).

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Journal Article | Published | English
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Physical Review B
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68
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041310(R)
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Castillo C, Mendoza BS, Schmidt WG, Hahn PH, Bechstedt F. Layer-by-layer analysis of surface reflectance anisotropy in semiconductors. Physical Review B. 2003;68:041310(R). doi:10.1103/physrevb.68.041310
Castillo, C., Mendoza, B. S., Schmidt, W. G., Hahn, P. H., & Bechstedt, F. (2003). Layer-by-layer analysis of surface reflectance anisotropy in semiconductors. Physical Review B, 68, 041310(R). https://doi.org/10.1103/physrevb.68.041310
@article{Castillo_Mendoza_Schmidt_Hahn_Bechstedt_2003, title={Layer-by-layer analysis of surface reflectance anisotropy in semiconductors}, volume={68}, DOI={10.1103/physrevb.68.041310}, journal={Physical Review B}, author={Castillo, C. and Mendoza, Bernardo S. and Schmidt, Wolf Gero and Hahn, P. H. and Bechstedt, F.}, year={2003}, pages={041310(R)} }
Castillo, C., Bernardo S. Mendoza, Wolf Gero Schmidt, P. H. Hahn, and F. Bechstedt. “Layer-by-Layer Analysis of Surface Reflectance Anisotropy in Semiconductors.” Physical Review B 68 (2003): 041310(R). https://doi.org/10.1103/physrevb.68.041310.
C. Castillo, B. S. Mendoza, W. G. Schmidt, P. H. Hahn, and F. Bechstedt, “Layer-by-layer analysis of surface reflectance anisotropy in semiconductors,” Physical Review B, vol. 68, p. 041310(R), 2003.
Castillo, C., et al. “Layer-by-Layer Analysis of Surface Reflectance Anisotropy in Semiconductors.” Physical Review B, vol. 68, 2003, p. 041310(R), doi:10.1103/physrevb.68.041310.

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