The Impact of Developer Experience in Using Java Cryptography

M. Hazhirpasand, M. Ghafari, S. Krüger, E. Bodden, O. Nierstrasz, in: 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM), 2019, pp. 1–6.

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2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)
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1-6
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Hazhirpasand M, Ghafari M, Krüger S, Bodden E, Nierstrasz O. The Impact of Developer Experience in Using Java Cryptography. In: 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM). ; 2019:1-6. doi:10.1109/ESEM.2019.8870184
Hazhirpasand, M., Ghafari, M., Krüger, S., Bodden, E., & Nierstrasz, O. (2019). The Impact of Developer Experience in Using Java Cryptography. In 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) (pp. 1–6). https://doi.org/10.1109/ESEM.2019.8870184
@inproceedings{Hazhirpasand_Ghafari_Krüger_Bodden_Nierstrasz_2019, title={The Impact of Developer Experience in Using Java Cryptography}, DOI={10.1109/ESEM.2019.8870184}, booktitle={2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)}, author={Hazhirpasand, Mohammadreza and Ghafari, Mohammad and Krüger, Stefan and Bodden, Eric and Nierstrasz, Oskar}, year={2019}, pages={1–6} }
Hazhirpasand, Mohammadreza, Mohammad Ghafari, Stefan Krüger, Eric Bodden, and Oskar Nierstrasz. “The Impact of Developer Experience in Using Java Cryptography.” In 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM), 1–6, 2019. https://doi.org/10.1109/ESEM.2019.8870184.
M. Hazhirpasand, M. Ghafari, S. Krüger, E. Bodden, and O. Nierstrasz, “The Impact of Developer Experience in Using Java Cryptography,” in 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM), 2019, pp. 1–6.
Hazhirpasand, Mohammadreza, et al. “The Impact of Developer Experience in Using Java Cryptography.” 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM), 2019, pp. 1–6, doi:10.1109/ESEM.2019.8870184.

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