Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model

J. Lienen, E. Hüllermeier, R. Ewerth, N. Nommensen, in: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR, 2021.

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Proceedings Title
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR
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IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR
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Online
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2021-06-19 – 2021-06-25
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Lienen J, Hüllermeier E, Ewerth R, Nommensen N. Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR. ; 2021.
Lienen, J., Hüllermeier, E., Ewerth, R., & Nommensen, N. (2021). Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR. Online.
@inproceedings{Lienen_Hüllermeier_Ewerth_Nommensen_2021, title={Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model}, booktitle={Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR}, author={Lienen, Julian and Hüllermeier, Eyke and Ewerth, Ralph and Nommensen, Nils}, year={2021} }
Lienen, Julian, Eyke Hüllermeier, Ralph Ewerth, and Nils Nommensen. “Monocular Depth Estimation via Listwise Ranking Using the Plackett-Luce Model.” In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR, 2021.
J. Lienen, E. Hüllermeier, R. Ewerth, and N. Nommensen, “Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR, Online, 2021.
Lienen, Julian, et al. “Monocular Depth Estimation via Listwise Ranking Using the Plackett-Luce Model.” Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR, 2021.

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