Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films
M. Prenzel, M.T. de los Arcos de Pedro, A. Kortmann, J. Winter, A. von Keudell, Journal of Applied Physics (2012).
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Journal Article
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| English
Author
Prenzel, Marina;
de los Arcos de Pedro, Maria TeresaLibreCat;
Kortmann, Annika;
Winter, Jörg;
von Keudell, Achim
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Publishing Year
Journal Title
Journal of Applied Physics
Article Number
103306
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Prenzel M, de los Arcos de Pedro MT, Kortmann A, Winter J, von Keudell A. Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films. Journal of Applied Physics. Published online 2012. doi:10.1063/1.4767383
Prenzel, M., de los Arcos de Pedro, M. T., Kortmann, A., Winter, J., & von Keudell, A. (2012). Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films. Journal of Applied Physics, Article 103306. https://doi.org/10.1063/1.4767383
@article{Prenzel_de los Arcos de Pedro_Kortmann_Winter_von Keudell_2012, title={Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films}, DOI={10.1063/1.4767383}, number={103306}, journal={Journal of Applied Physics}, author={Prenzel, Marina and de los Arcos de Pedro, Maria Teresa and Kortmann, Annika and Winter, Jörg and von Keudell, Achim}, year={2012} }
Prenzel, Marina, Maria Teresa de los Arcos de Pedro, Annika Kortmann, Jörg Winter, and Achim von Keudell. “Embedded Argon as a Tool for Sampling Local Structure in Thin Plasma Deposited Aluminum Oxide Films.” Journal of Applied Physics, 2012. https://doi.org/10.1063/1.4767383.
M. Prenzel, M. T. de los Arcos de Pedro, A. Kortmann, J. Winter, and A. von Keudell, “Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films,” Journal of Applied Physics, Art. no. 103306, 2012, doi: 10.1063/1.4767383.
Prenzel, Marina, et al. “Embedded Argon as a Tool for Sampling Local Structure in Thin Plasma Deposited Aluminum Oxide Films.” Journal of Applied Physics, 103306, 2012, doi:10.1063/1.4767383.
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