Microscopic analysis of extreme nonlinear optics in semiconductor nanostructures

D. Golde, T. Meier, S.W. Koch, Journal of the Optical Society of America B (2006).

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Journal Article | Published | English
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Journal of the Optical Society of America B
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2559
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Golde D, Meier T, Koch SW. Microscopic analysis of extreme nonlinear optics in semiconductor nanostructures. Journal of the Optical Society of America B. 2006. doi:10.1364/josab.23.002559
Golde, D., Meier, T., & Koch, S. W. (2006). Microscopic analysis of extreme nonlinear optics in semiconductor nanostructures. Journal of the Optical Society of America B. https://doi.org/10.1364/josab.23.002559
@article{Golde_Meier_Koch_2006, title={Microscopic analysis of extreme nonlinear optics in semiconductor nanostructures}, DOI={10.1364/josab.23.002559}, number={2559}, journal={Journal of the Optical Society of America B}, author={Golde, Daniel and Meier, Torsten and Koch, Stephan W.}, year={2006} }
Golde, Daniel, Torsten Meier, and Stephan W. Koch. “Microscopic Analysis of Extreme Nonlinear Optics in Semiconductor Nanostructures.” Journal of the Optical Society of America B, 2006. https://doi.org/10.1364/josab.23.002559.
D. Golde, T. Meier, and S. W. Koch, “Microscopic analysis of extreme nonlinear optics in semiconductor nanostructures,” Journal of the Optical Society of America B, 2006.
Golde, Daniel, et al. “Microscopic Analysis of Extreme Nonlinear Optics in Semiconductor Nanostructures.” Journal of the Optical Society of America B, 2559, 2006, doi:10.1364/josab.23.002559.

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