Five-Wave-Mixing Spectroscopy of Ultrafast Electron Dynamics at a Si(001) Surface
C. Voelkmann, M. Reichelt, T. Meier, S.W. Koch, U. Höfer, Physical Review Letters 92 (2004).
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Abstract
The optically induced electron dynamics at a Si(001) surface is studied using a five-wave-mixing setup which measures the diffracted second-harmonic intensity induced by three ultrashort (13 fs) laser pulses. Depending on the time ordering of the pulses, this technique is capable of monitoring the temporal evolution of photoexcited one- or two-photon coherences, or populations. For a particular pulse sequence, the experiments show a delayed rise and a decay of the diffracted signal intensity on time scales of 50 and 250 fs, respectively. This response can be described by optical Bloch equations by including rapid scattering of the photoexcited carriers in the D(down)band of Si(001).
Publishing Year
Journal Title
Physical Review Letters
Volume
92
Issue
12
Article Number
127405
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Voelkmann C, Reichelt M, Meier T, Koch SW, Höfer U. Five-Wave-Mixing Spectroscopy of Ultrafast Electron Dynamics at a Si(001) Surface. Physical Review Letters. 2004;92(12). doi:10.1103/physrevlett.92.127405
Voelkmann, C., Reichelt, M., Meier, T., Koch, S. W., & Höfer, U. (2004). Five-Wave-Mixing Spectroscopy of Ultrafast Electron Dynamics at a Si(001) Surface. Physical Review Letters, 92(12), Article 127405. https://doi.org/10.1103/physrevlett.92.127405
@article{Voelkmann_Reichelt_Meier_Koch_Höfer_2004, title={Five-Wave-Mixing Spectroscopy of Ultrafast Electron Dynamics at a Si(001) Surface}, volume={92}, DOI={10.1103/physrevlett.92.127405}, number={12127405}, journal={Physical Review Letters}, author={Voelkmann, C. and Reichelt, Matthias and Meier, Torsten and Koch, S. W. and Höfer, U.}, year={2004} }
Voelkmann, C., Matthias Reichelt, Torsten Meier, S. W. Koch, and U. Höfer. “Five-Wave-Mixing Spectroscopy of Ultrafast Electron Dynamics at a Si(001) Surface.” Physical Review Letters 92, no. 12 (2004). https://doi.org/10.1103/physrevlett.92.127405.
C. Voelkmann, M. Reichelt, T. Meier, S. W. Koch, and U. Höfer, “Five-Wave-Mixing Spectroscopy of Ultrafast Electron Dynamics at a Si(001) Surface,” Physical Review Letters, vol. 92, no. 12, Art. no. 127405, 2004, doi: 10.1103/physrevlett.92.127405.
Voelkmann, C., et al. “Five-Wave-Mixing Spectroscopy of Ultrafast Electron Dynamics at a Si(001) Surface.” Physical Review Letters, vol. 92, no. 12, 127405, 2004, doi:10.1103/physrevlett.92.127405.
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