Automated Wireless Sensor Network Testing

J. Beutel, M. Dyer, R. Lim, C. Plessl, M. Woehrle, M. Yuecel, L. Thiele, in: Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, Piscataway, NJ, USA, 2007, pp. 303–303.

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Conference Paper | English
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Beutel, Jan; Dyer, Matthias; Lim, Roman; Plessl, ChristianLibreCat ; Woehrle, Matthias; Yuecel, Mustafa; Thiele, Lothar
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Proc. Int. Conf. Networked Sensing Systems (INSS)
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303-303
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Beutel J, Dyer M, Lim R, et al. Automated Wireless Sensor Network Testing. In: Proc. Int. Conf. Networked Sensing Systems (INSS). IEEE; 2007:303-303. doi:10.1109/INSS.2007.4297445
Beutel, J., Dyer, M., Lim, R., Plessl, C., Woehrle, M., Yuecel, M., & Thiele, L. (2007). Automated Wireless Sensor Network Testing. Proc. Int. Conf. Networked Sensing Systems (INSS), 303–303. https://doi.org/10.1109/INSS.2007.4297445
@inproceedings{Beutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place={Piscataway, NJ, USA}, title={Automated Wireless Sensor Network Testing}, DOI={10.1109/INSS.2007.4297445}, booktitle={Proc. Int. Conf. Networked Sensing Systems (INSS)}, publisher={IEEE}, author={Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar}, year={2007}, pages={303–303} }
Beutel, Jan, Matthias Dyer, Roman Lim, Christian Plessl, Matthias Woehrle, Mustafa Yuecel, and Lothar Thiele. “Automated Wireless Sensor Network Testing.” In Proc. Int. Conf. Networked Sensing Systems (INSS), 303–303. Piscataway, NJ, USA: IEEE, 2007. https://doi.org/10.1109/INSS.2007.4297445.
J. Beutel et al., “Automated Wireless Sensor Network Testing,” in Proc. Int. Conf. Networked Sensing Systems (INSS), 2007, pp. 303–303, doi: 10.1109/INSS.2007.4297445.
Beutel, Jan, et al. “Automated Wireless Sensor Network Testing.” Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, 2007, pp. 303–303, doi:10.1109/INSS.2007.4297445.

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