Generation and Time-Resolved Detection of Coherently Controlled Electric Currents at Surfaces

J. Güdde, M. Rohleder, T. Meier, S.W. Koch, U. Höfer, in: Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, 2013.

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Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
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Güdde J, Rohleder M, Meier T, Koch SW, Höfer U. Generation and Time-Resolved Detection of Coherently Controlled Electric Currents at Surfaces. In: Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing. ; 2013. doi:10.1364/fio.2008.fmi3
Güdde, J., Rohleder, M., Meier, T., Koch, S. W., & Höfer, U. (2013). Generation and Time-Resolved Detection of Coherently Controlled Electric Currents at Surfaces. Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing. https://doi.org/10.1364/fio.2008.fmi3
@inproceedings{Güdde_Rohleder_Meier_Koch_Höfer_2013, title={Generation and Time-Resolved Detection of Coherently Controlled Electric Currents at Surfaces}, DOI={10.1364/fio.2008.fmi3}, booktitle={Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing}, author={Güdde, J. and Rohleder, M. and Meier, Torsten and Koch, S.W. and Höfer, U.}, year={2013} }
Güdde, J., M. Rohleder, Torsten Meier, S.W. Koch, and U. Höfer. “Generation and Time-Resolved Detection of Coherently Controlled Electric Currents at Surfaces.” In Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, 2013. https://doi.org/10.1364/fio.2008.fmi3.
J. Güdde, M. Rohleder, T. Meier, S. W. Koch, and U. Höfer, “Generation and Time-Resolved Detection of Coherently Controlled Electric Currents at Surfaces,” 2013, doi: 10.1364/fio.2008.fmi3.
Güdde, J., et al. “Generation and Time-Resolved Detection of Coherently Controlled Electric Currents at Surfaces.” Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, 2013, doi:10.1364/fio.2008.fmi3.

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