IP-XACT based System Level Mutation Testing
T. Xie, W. Müller, in: Proceedings of the 16th IEEE International High Level Design Validation and Test Workshop (HLDVT), 2011.
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Xie, Tao;
Müller, WolfgangLibreCat
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Proceedings of the 16th IEEE International High Level Design Validation and Test Workshop (HLDVT)
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Xie T, Müller W. IP-XACT based System Level Mutation Testing. In: Proceedings of the 16th IEEE International High Level Design Validation and Test Workshop (HLDVT). ; 2011.
Xie, T., & Müller, W. (2011). IP-XACT based System Level Mutation Testing. Proceedings of the 16th IEEE International High Level Design Validation and Test Workshop (HLDVT).
@inproceedings{Xie_Müller_2011, title={IP-XACT based System Level Mutation Testing}, booktitle={Proceedings of the 16th IEEE International High Level Design Validation and Test Workshop (HLDVT)}, author={Xie, Tao and Müller, Wolfgang}, year={2011} }
Xie, Tao, and Wolfgang Müller. “IP-XACT Based System Level Mutation Testing.” In Proceedings of the 16th IEEE International High Level Design Validation and Test Workshop (HLDVT), 2011.
T. Xie and W. Müller, “IP-XACT based System Level Mutation Testing,” 2011.
Xie, Tao, and Wolfgang Müller. “IP-XACT Based System Level Mutation Testing.” Proceedings of the 16th IEEE International High Level Design Validation and Test Workshop (HLDVT), 2011.
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