Virtual Test Environment for Self-Optimizing Systems
J. St{\"o}cklein, W. M{\"u}ller, D. Baldin, Tao Xie, (2013).
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Conference Paper
| Published
| English
Author
St{\"o}cklein, J{\"o}rg ;
M{\"u}ller, Wolfgang;
Baldin, Daniel;
Xie, Tao
Publishing Year
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ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA2013)
Conference Date
2013-08-04 – 2013-08-07
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Cite this
St{\"o}cklein J, M{\"u}ller W, Baldin D, Xie Tao. Virtual Test Environment for Self-Optimizing Systems. Published online 2013.
St{\"o}cklein, J., M{\"u}ller, W., Baldin, D., & Xie, Tao. (2013). Virtual Test Environment for Self-Optimizing Systems. ASME.
@article{St{\"o}cklein_M{\"u}ller_Baldin_Xie_2013, series={ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA2013)}, title={Virtual Test Environment for Self-Optimizing Systems}, publisher={ASME}, author={St{\"o}cklein, J{\"o}rg and M{\"u}ller, Wolfgang and Baldin, Daniel and Xie, Tao}, year={2013}, collection={ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA2013)} }
St{\"o}cklein, J{\"o}rg , Wolfgang M{\"u}ller, Daniel Baldin, and Tao Xie. “Virtual Test Environment for Self-Optimizing Systems.” ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA2013). ASME, 2013.
J. St{\"o}cklein, W. M{\"u}ller, D. Baldin, and Tao Xie, “Virtual Test Environment for Self-Optimizing Systems.” ASME, 2013.
St{\"o}cklein, J{\"o}rg, et al. Virtual Test Environment for Self-Optimizing Systems. ASME, 2013.
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