Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters

D. Fang, A. Zazzi, J. Mueller, D. Dray, C. Fullner, P. Marin-Palomo, A. Tabatabaei Mashayekh, A. Dipta Das, M. Weizel, S. Gudyriev, W. Freude, S. Randel, J.C. Scheytt, J. Witzens, C. Koos, Journal of Lightwave Technology (2021) 1–1.

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Journal Article | Published | English
Author
Fang, Dengyang; Zazzi, Andrea; Mueller, Juliana; Dray, Daniel; Fullner, Christoph; Marin-Palomo, Pablo; Tabatabaei Mashayekh, Alireza; Dipta Das, Arka; Weizel, MaximLibreCat ; Gudyriev, Sergiy; Freude, Wolfgang; Randel, Sebastian
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Abstract
We demonstrate an optical arbitrary waveform measurement (OAWM) system that exploits a bank of silicon photonic (SiP) frequency-tunable coupled-resonator optical waveguide (CROW) filters for gapless spectral slicing of broadband optical signals. The spectral slices are coherently detected using a frequency comb as a multi-wavelength local oscillator (LO) and stitched together by digital signal processing (DSP). For high-quality signal reconstruction, we have implemented a maximum-ratio combining (MRC) technique based on precise calibration of the complex-valued opto-electronic transfer functions of all detection paths. In a proof-of-concept experiment, we demonstrate the viability of the scheme by implementing a four-channel system that offers an overall detection bandwidth of 140 GHz. Exploiting a femtosecond laser with precisely known pulse shape for calibration along with dynamic amplitude and phase estimation, we reconstruct 100 GBd QPSK, 16QAM and 64QAM optical data signals. The reconstructed signals show improved quality compared to that obtained with a single high-speed intradyne receiver, while the electronic bandwidth requirements of the individual coherent receivers are greatly reduced.
Publishing Year
Journal Title
Journal of Lightwave Technology
Page
1-1
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Cite this

Fang D, Zazzi A, Mueller J, et al. Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters. Journal of Lightwave Technology. Published online 2021:1-1. doi:10.1109/jlt.2021.3130764
Fang, D., Zazzi, A., Mueller, J., Dray, D., Fullner, C., Marin-Palomo, P., Tabatabaei Mashayekh, A., Dipta Das, A., Weizel, M., Gudyriev, S., Freude, W., Randel, S., Scheytt, J. C., Witzens, J., & Koos, C. (2021). Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters. Journal of Lightwave Technology, 1–1. https://doi.org/10.1109/jlt.2021.3130764
@article{Fang_Zazzi_Mueller_Dray_Fullner_Marin-Palomo_Tabatabaei Mashayekh_Dipta Das_Weizel_Gudyriev_et al._2021, title={Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters}, DOI={10.1109/jlt.2021.3130764}, journal={Journal of Lightwave Technology}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Fang, Dengyang and Zazzi, Andrea and Mueller, Juliana and Dray, Daniel and Fullner, Christoph and Marin-Palomo, Pablo and Tabatabaei Mashayekh, Alireza and Dipta Das, Arka and Weizel, Maxim and Gudyriev, Sergiy and et al.}, year={2021}, pages={1–1} }
Fang, Dengyang, Andrea Zazzi, Juliana Mueller, Daniel Dray, Christoph Fullner, Pablo Marin-Palomo, Alireza Tabatabaei Mashayekh, et al. “Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters.” Journal of Lightwave Technology, 2021, 1–1. https://doi.org/10.1109/jlt.2021.3130764.
D. Fang et al., “Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters,” Journal of Lightwave Technology, pp. 1–1, 2021, doi: 10.1109/jlt.2021.3130764.
Fang, Dengyang, et al. “Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters.” Journal of Lightwave Technology, Institute of Electrical and Electronics Engineers (IEEE), 2021, pp. 1–1, doi:10.1109/jlt.2021.3130764.
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