Compositional {CSP} Traces Refinement Checking

H. Wehrheim, D. Wonisch, Electr. Notes Theor. Comput. Sci. (2009) 135--151.

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Electr. Notes Theor. Comput. Sci.
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2
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135--151
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Wehrheim H, Wonisch D. Compositional {CSP} Traces Refinement Checking. Electr Notes Theor Comput Sci. 2009;(2):135--151. doi:10.1016/j.entcs.2009.08.022
Wehrheim, H., & Wonisch, D. (2009). Compositional {CSP} Traces Refinement Checking. Electr. Notes Theor. Comput. Sci., (2), 135--151. https://doi.org/10.1016/j.entcs.2009.08.022
@article{Wehrheim_Wonisch_2009, title={Compositional {CSP} Traces Refinement Checking}, DOI={10.1016/j.entcs.2009.08.022}, number={2}, journal={Electr. Notes Theor. Comput. Sci.}, author={Wehrheim, Heike and Wonisch, Daniel}, year={2009}, pages={135--151} }
Wehrheim, Heike, and Daniel Wonisch. “Compositional {CSP} Traces Refinement Checking.” Electr. Notes Theor. Comput. Sci., no. 2 (2009): 135--151. https://doi.org/10.1016/j.entcs.2009.08.022.
H. Wehrheim and D. Wonisch, “Compositional {CSP} Traces Refinement Checking,” Electr. Notes Theor. Comput. Sci., no. 2, pp. 135--151, 2009.
Wehrheim, Heike, and Daniel Wonisch. “Compositional {CSP} Traces Refinement Checking.” Electr. Notes Theor. Comput. Sci., no. 2, 2009, pp. 135--151, doi:10.1016/j.entcs.2009.08.022.

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