AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development

J. Maalouly, D. Hemker, C. Hedayat, C. Rückert, I. Kaufmann, M. Olbrich, S. Lange, H. Mathis, in: 2022 Kleinheubach Conference, IEEE, Miltenberg, Germany, 2022.

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Conference Paper | Published | English
Author
Maalouly, Jad; Hemker, Dennis; Hedayat, Christian; Rückert, Christian; Kaufmann, Ivan; Olbrich, Marcel; Lange, SvenLibreCat; Mathis, Harald
Abstract
In this paper, machine learning techniques will be used to classify different PCB layouts given their electromagnetic frequency spectra. These spectra result from a simulated near-field measurement of electric field strengths at different locations. Measured values consist of real and imaginary parts (amplitude and phase) in X, Y and Z directions. Training data was obtained in the time domain by varying transmission line geometries (size, distance and signaling). It was then transformed into the frequency domain and used as deep neural network input. Principal component analysis was applied to reduce the sample dimension. The results show that classifying different designs is possible with high accuracy based on synthetic data. Future work comprises measurements of real, custom-made PCB with varying parameters to adapt the simulation model and also test the neural network. Finally, the trained model could be used to give hints about the error’s cause when overshooting EMC limits.
Publishing Year
Proceedings Title
2022 Kleinheubach Conference
Conference
2022 Kleinheubach Conference
Conference Location
Miltenberg, Germany
Conference Date
2022-09-27 – 2022-09-29
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Maalouly J, Hemker D, Hedayat C, et al. AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development. In: 2022 Kleinheubach Conference. IEEE; 2022.
Maalouly, J., Hemker, D., Hedayat, C., Rückert, C., Kaufmann, I., Olbrich, M., Lange, S., & Mathis, H. (2022). AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development. 2022 Kleinheubach Conference. 2022 Kleinheubach Conference, Miltenberg, Germany.
@inproceedings{Maalouly_Hemker_Hedayat_Rückert_Kaufmann_Olbrich_Lange_Mathis_2022, place={Miltenberg, Germany}, title={AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development}, booktitle={2022 Kleinheubach Conference}, publisher={IEEE}, author={Maalouly, Jad and Hemker, Dennis and Hedayat, Christian and Rückert, Christian and Kaufmann, Ivan and Olbrich, Marcel and Lange, Sven and Mathis, Harald}, year={2022} }
Maalouly, Jad, Dennis Hemker, Christian Hedayat, Christian Rückert, Ivan Kaufmann, Marcel Olbrich, Sven Lange, and Harald Mathis. “AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development.” In 2022 Kleinheubach Conference. Miltenberg, Germany: IEEE, 2022.
J. Maalouly et al., “AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development,” presented at the 2022 Kleinheubach Conference, Miltenberg, Germany, 2022.
Maalouly, Jad, et al. “AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development.” 2022 Kleinheubach Conference, IEEE, 2022.

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