A Comprehensive Study on Face Recognition Biases Beyond Demographics
P. Terhörst, J.N. Kolf, M. Huber, F. Kirchbuchner, N. Damer, A.M. Moreno, J. Fierrez, A. Kuijper, IEEE Transactions on Technology and Society 3 (2022) 16–30.
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Journal Article
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Author
Terhörst, PhilippLibreCat;
Kolf, Jan Niklas;
Huber, Marco;
Kirchbuchner, Florian;
Damer, Naser;
Moreno, Aythami Morales;
Fierrez, Julian;
Kuijper, Arjan
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Publishing Year
Journal Title
IEEE Transactions on Technology and Society
Volume
3
Issue
1
Page
16-30
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Terhörst P, Kolf JN, Huber M, et al. A Comprehensive Study on Face Recognition Biases Beyond Demographics. IEEE Transactions on Technology and Society. 2022;3(1):16-30. doi:10.1109/TTS.2021.3111823
Terhörst, P., Kolf, J. N., Huber, M., Kirchbuchner, F., Damer, N., Moreno, A. M., Fierrez, J., & Kuijper, A. (2022). A Comprehensive Study on Face Recognition Biases Beyond Demographics. IEEE Transactions on Technology and Society, 3(1), 16–30. https://doi.org/10.1109/TTS.2021.3111823
@article{Terhörst_Kolf_Huber_Kirchbuchner_Damer_Moreno_Fierrez_Kuijper_2022, title={A Comprehensive Study on Face Recognition Biases Beyond Demographics}, volume={3}, DOI={10.1109/TTS.2021.3111823}, number={1}, journal={IEEE Transactions on Technology and Society}, author={Terhörst, Philipp and Kolf, Jan Niklas and Huber, Marco and Kirchbuchner, Florian and Damer, Naser and Moreno, Aythami Morales and Fierrez, Julian and Kuijper, Arjan}, year={2022}, pages={16–30} }
Terhörst, Philipp, Jan Niklas Kolf, Marco Huber, Florian Kirchbuchner, Naser Damer, Aythami Morales Moreno, Julian Fierrez, and Arjan Kuijper. “A Comprehensive Study on Face Recognition Biases Beyond Demographics.” IEEE Transactions on Technology and Society 3, no. 1 (2022): 16–30. https://doi.org/10.1109/TTS.2021.3111823.
P. Terhörst et al., “A Comprehensive Study on Face Recognition Biases Beyond Demographics,” IEEE Transactions on Technology and Society, vol. 3, no. 1, pp. 16–30, 2022, doi: 10.1109/TTS.2021.3111823.
Terhörst, Philipp, et al. “A Comprehensive Study on Face Recognition Biases Beyond Demographics.” IEEE Transactions on Technology and Society, vol. 3, no. 1, 2022, pp. 16–30, doi:10.1109/TTS.2021.3111823.
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