Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats
T. Pfau, R. Noé, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS 16 (2010) 1210–1216.
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Author
Pfau, Timo;
Noé, ReinholdLibreCat 
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Journal Title
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
Volume
16
Issue
5
Page
1210-1216
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Pfau T, Noé R. Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS. 2010;16(5):1210-1216. doi:10.1109/JSTQE.2009.2034472
Pfau, T., & Noé, R. (2010). Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 16(5), 1210–1216. https://doi.org/10.1109/JSTQE.2009.2034472
@article{Pfau_Noé_2010, title={Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats}, volume={16}, DOI={10.1109/JSTQE.2009.2034472}, number={5}, journal={IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS}, author={Pfau, Timo and Noé, Reinhold}, year={2010}, pages={1210–1216} }
Pfau, Timo, and Reinhold Noé. “Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats.” IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS 16, no. 5 (2010): 1210–16. https://doi.org/10.1109/JSTQE.2009.2034472.
T. Pfau and R. Noé, “Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats,” IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, vol. 16, no. 5, pp. 1210–1216, 2010, doi: 10.1109/JSTQE.2009.2034472.
Pfau, Timo, and Reinhold Noé. “Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats.” IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, vol. 16, no. 5, 2010, pp. 1210–16, doi:10.1109/JSTQE.2009.2034472.
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