Classification Trees for Functional Coverage and Random Test Generation
A. Krupp, W. Müller, in: Proceedings of the Design Automation & Test in Europe Conference, IEEE, Munich, Germany, 2006.
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Krupp, Alexander;
Müller, WolfgangLibreCat
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This article presents the classification tree method for functional verification to close the gap from the specification of a test plan to SystemVerilog (Chandra and Chakrabarty, 2001) test bench generation. Our method supports the systematic development of test configurations and is based on the classification tree method for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for random test generation as well as for functional coverage and property specification
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Proceedings of the Design Automation & Test in Europe Conference
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Krupp A, Müller W. Classification Trees for Functional Coverage and Random Test Generation. In: Proceedings of the Design Automation & Test in Europe Conference. IEEE; 2006. doi:10.1109/DATE.2006.243902
Krupp, A., & Müller, W. (2006). Classification Trees for Functional Coverage and Random Test Generation. Proceedings of the Design Automation & Test in Europe Conference. https://doi.org/10.1109/DATE.2006.243902
@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification Trees for Functional Coverage and Random Test Generation}, DOI={10.1109/DATE.2006.243902}, booktitle={Proceedings of the Design Automation & Test in Europe Conference}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006} }
Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” In Proceedings of the Design Automation & Test in Europe Conference. Munich, Germany: IEEE, 2006. https://doi.org/10.1109/DATE.2006.243902.
A. Krupp and W. Müller, “Classification Trees for Functional Coverage and Random Test Generation,” 2006, doi: 10.1109/DATE.2006.243902.
Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” Proceedings of the Design Automation & Test in Europe Conference, IEEE, 2006, doi:10.1109/DATE.2006.243902.
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