Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods
T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, H. Kuhn, in: 2022 Smart Systems Integration (SSI), IEEE, 2022.
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Sander, Tom;
Lange, Sven;
Hilleringmann, UlrichLibreCat;
Geneis, Volker;
Hedayat, Christian;
Kuhn, Harald
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2022 Smart Systems Integration (SSI)
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Sander T, Lange S, Hilleringmann U, Geneis V, Hedayat C, Kuhn H. Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods. In: 2022 Smart Systems Integration (SSI). IEEE; 2022. doi:10.1109/ssi56489.2022.9901433
Sander, T., Lange, S., Hilleringmann, U., Geneis, V., Hedayat, C., & Kuhn, H. (2022). Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods. 2022 Smart Systems Integration (SSI). https://doi.org/10.1109/ssi56489.2022.9901433
@inproceedings{Sander_Lange_Hilleringmann_Geneis_Hedayat_Kuhn_2022, title={Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods}, DOI={10.1109/ssi56489.2022.9901433}, booktitle={2022 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Sander, Tom and Lange, Sven and Hilleringmann, Ulrich and Geneis, Volker and Hedayat, Christian and Kuhn, Harald}, year={2022} }
Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneis, Christian Hedayat, and Harald Kuhn. “Detection of Defects on Irregularly Structured Surfaces Using Supervised and Semi-Supervised Learning Methods.” In 2022 Smart Systems Integration (SSI). IEEE, 2022. https://doi.org/10.1109/ssi56489.2022.9901433.
T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, and H. Kuhn, “Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods,” 2022, doi: 10.1109/ssi56489.2022.9901433.
Sander, Tom, et al. “Detection of Defects on Irregularly Structured Surfaces Using Supervised and Semi-Supervised Learning Methods.” 2022 Smart Systems Integration (SSI), IEEE, 2022, doi:10.1109/ssi56489.2022.9901433.
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