Influence of electrode metallization on thin-film transistor performance
J. Reker, T. Meyers, F.F. Vidor, T.-H. Joubert, U. Hilleringmann, in: 2021 IEEE AFRICON, IEEE, 2021.
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Reker, Julia;
Meyers, Thorsten;
Vidor, Fabio F.;
Joubert, Trudi-Heleen;
Hilleringmann, UlrichLibreCat
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2021 IEEE AFRICON
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Reker J, Meyers T, Vidor FF, Joubert T-H, Hilleringmann U. Influence of electrode metallization on thin-film transistor performance. In: 2021 IEEE AFRICON. IEEE; 2021. doi:10.1109/africon51333.2021.9570953
Reker, J., Meyers, T., Vidor, F. F., Joubert, T.-H., & Hilleringmann, U. (2021). Influence of electrode metallization on thin-film transistor performance. 2021 IEEE AFRICON. https://doi.org/10.1109/africon51333.2021.9570953
@inproceedings{Reker_Meyers_Vidor_Joubert_Hilleringmann_2021, title={Influence of electrode metallization on thin-film transistor performance}, DOI={10.1109/africon51333.2021.9570953}, booktitle={2021 IEEE AFRICON}, publisher={IEEE}, author={Reker, Julia and Meyers, Thorsten and Vidor, Fabio F. and Joubert, Trudi-Heleen and Hilleringmann, Ulrich}, year={2021} }
Reker, Julia, Thorsten Meyers, Fabio F. Vidor, Trudi-Heleen Joubert, and Ulrich Hilleringmann. “Influence of Electrode Metallization on Thin-Film Transistor Performance.” In 2021 IEEE AFRICON. IEEE, 2021. https://doi.org/10.1109/africon51333.2021.9570953.
J. Reker, T. Meyers, F. F. Vidor, T.-H. Joubert, and U. Hilleringmann, “Influence of electrode metallization on thin-film transistor performance,” 2021, doi: 10.1109/africon51333.2021.9570953.
Reker, Julia, et al. “Influence of Electrode Metallization on Thin-Film Transistor Performance.” 2021 IEEE AFRICON, IEEE, 2021, doi:10.1109/africon51333.2021.9570953.
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