Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors
T.E. Becker, F.F. Vidor, G.I. Wirth, T. Meyers, J. Reker, U. Hilleringmann, in: 2018 IEEE 19th Latin-American Test Symposium (LATS), IEEE, 2018.
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Author
Becker, Thales E.;
Vidor, Fabio F.;
Wirth, Gilson I.;
Meyers, Thorsten;
Reker, Julia;
Hilleringmann, UlrichLibreCat
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2018 IEEE 19th Latin-American Test Symposium (LATS)
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Becker TE, Vidor FF, Wirth GI, Meyers T, Reker J, Hilleringmann U. Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. In: 2018 IEEE 19th Latin-American Test Symposium (LATS). IEEE; 2018. doi:10.1109/latw.2018.8349695
Becker, T. E., Vidor, F. F., Wirth, G. I., Meyers, T., Reker, J., & Hilleringmann, U. (2018). Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. 2018 IEEE 19th Latin-American Test Symposium (LATS). https://doi.org/10.1109/latw.2018.8349695
@inproceedings{Becker_Vidor_Wirth_Meyers_Reker_Hilleringmann_2018, title={Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors}, DOI={10.1109/latw.2018.8349695}, booktitle={2018 IEEE 19th Latin-American Test Symposium (LATS)}, publisher={IEEE}, author={Becker, Thales E. and Vidor, Fabio F. and Wirth, Gilson I. and Meyers, Thorsten and Reker, Julia and Hilleringmann, Ulrich}, year={2018} }
Becker, Thales E., Fabio F. Vidor, Gilson I. Wirth, Thorsten Meyers, Julia Reker, and Ulrich Hilleringmann. “Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors.” In 2018 IEEE 19th Latin-American Test Symposium (LATS). IEEE, 2018. https://doi.org/10.1109/latw.2018.8349695.
T. E. Becker, F. F. Vidor, G. I. Wirth, T. Meyers, J. Reker, and U. Hilleringmann, “Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors,” 2018, doi: 10.1109/latw.2018.8349695.
Becker, Thales E., et al. “Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors.” 2018 IEEE 19th Latin-American Test Symposium (LATS), IEEE, 2018, doi:10.1109/latw.2018.8349695.
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