Characterization and Matching Analysis of 50 nm-NMOS-Transistors
J.T. Horstmann, U. Hilleringmann, K. Goser, in: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–256.
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Horstmann, J. T.;
Hilleringmann, UlrichLibreCat;
Goser, K.
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ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference
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253-256
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Horstmann JT, Hilleringmann U, Goser K. Characterization and Matching Analysis of 50 nm-NMOS-Transistors. In: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference. ; 1996:253-256.
Horstmann, J. T., Hilleringmann, U., & Goser, K. (1996). Characterization and Matching Analysis of 50 nm-NMOS-Transistors. ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 253–256.
@inproceedings{Horstmann_Hilleringmann_Goser_1996, title={Characterization and Matching Analysis of 50 nm-NMOS-Transistors}, booktitle={ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference}, author={Horstmann, J. T. and Hilleringmann, Ulrich and Goser, K.}, year={1996}, pages={253–256} }
Horstmann, J. T., Ulrich Hilleringmann, and K. Goser. “Characterization and Matching Analysis of 50 Nm-NMOS-Transistors.” In ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 253–56, 1996.
J. T. Horstmann, U. Hilleringmann, and K. Goser, “Characterization and Matching Analysis of 50 nm-NMOS-Transistors,” in ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–256.
Horstmann, J. T., et al. “Characterization and Matching Analysis of 50 Nm-NMOS-Transistors.” ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–56.
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