Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission
I. Schonstein, J. Muller, U. Hilleringmann, K. Goser, in: ESSDERC ’93: 23rd European Solid State Device Research Conference, 1993, pp. 421–424.
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Schonstein, I.;
Muller, J.;
Hilleringmann, UlrichLibreCat;
Goser, K.
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ESSDERC ’93: 23rd European solid State Device Research Conference
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421-424
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Schonstein I, Muller J, Hilleringmann U, Goser K. Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission. In: ESSDERC ’93: 23rd European Solid State Device Research Conference. ; 1993:421-424.
Schonstein, I., Muller, J., Hilleringmann, U., & Goser, K. (1993). Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission. ESSDERC ’93: 23rd European Solid State Device Research Conference, 421–424.
@inproceedings{Schonstein_Muller_Hilleringmann_Goser_1993, title={Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission}, booktitle={ESSDERC ’93: 23rd European solid State Device Research Conference}, author={Schonstein, I. and Muller, J. and Hilleringmann, Ulrich and Goser, K.}, year={1993}, pages={421–424} }
Schonstein, I., J. Muller, Ulrich Hilleringmann, and K. Goser. “Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission.” In ESSDERC ’93: 23rd European Solid State Device Research Conference, 421–24, 1993.
I. Schonstein, J. Muller, U. Hilleringmann, and K. Goser, “Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission,” in ESSDERC ’93: 23rd European solid State Device Research Conference, 1993, pp. 421–424.
Schonstein, I., et al. “Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission.” ESSDERC ’93: 23rd European Solid State Device Research Conference, 1993, pp. 421–24.
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