TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography

J. Pauly, J. Lindner, in: 2012.

Download
No fulltext has been uploaded.
Conference Paper | English
Author
;
Publishing Year
Conference
E-MRS Fall Meeting 2012
Conference Location
Warsaw (Poland)
Conference Date
2012-09-17 – 2012-09-21
LibreCat-ID

Cite this

Pauly J, Lindner J. TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography. In: ; 2012.
Pauly, J., & Lindner, J. (2012). TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography. Presented at the E-MRS Fall Meeting 2012, Warsaw (Poland).
@inproceedings{Pauly_Lindner_2012, title={TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography}, author={Pauly, Johannes and Lindner, Jörg}, year={2012} }
Pauly, Johannes, and Jörg Lindner. “TEM Characterization of Nickel Nanodot Arrays on Silicon Formed by Nanosphere Lithography,” 2012.
J. Pauly and J. Lindner, “TEM Characterization of Nickel Nanodot Arrays on Silicon formed by Nanosphere Lithography,” presented at the E-MRS Fall Meeting 2012, Warsaw (Poland), 2012.
Pauly, Johannes, and Jörg Lindner. TEM Characterization of Nickel Nanodot Arrays on Silicon Formed by Nanosphere Lithography. 2012.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar