Near-field measurement of stochastic electromagnetic fields

J.A. Russer, N. Uddin, A.S. Awny, A. Thiede, P. Russer, IEEE Electromagnetic Compatibility Magazine 4 (2015) 79–85.

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Journal Article | Published | English
Author
Russer, Johannes A.; Uddin, Nasir; Awny, Ahmed Sanaa; Thiede, AndreasLibreCat; Russer, Peter
Publishing Year
Journal Title
IEEE Electromagnetic Compatibility Magazine
Volume
4
Issue
3
Page
79-85
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Russer JA, Uddin N, Awny AS, Thiede A, Russer P. Near-field measurement of stochastic electromagnetic fields. IEEE Electromagnetic Compatibility Magazine. 2015;4(3):79-85. doi:10.1109/memc.2015.7336761
Russer, J. A., Uddin, N., Awny, A. S., Thiede, A., & Russer, P. (2015). Near-field measurement of stochastic electromagnetic fields. IEEE Electromagnetic Compatibility Magazine, 4(3), 79–85. https://doi.org/10.1109/memc.2015.7336761
@article{Russer_Uddin_Awny_Thiede_Russer_2015, title={Near-field measurement of stochastic electromagnetic fields}, volume={4}, DOI={10.1109/memc.2015.7336761}, number={3}, journal={IEEE Electromagnetic Compatibility Magazine}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Russer, Johannes A. and Uddin, Nasir and Awny, Ahmed Sanaa and Thiede, Andreas and Russer, Peter}, year={2015}, pages={79–85} }
Russer, Johannes A., Nasir Uddin, Ahmed Sanaa Awny, Andreas Thiede, and Peter Russer. “Near-Field Measurement of Stochastic Electromagnetic Fields.” IEEE Electromagnetic Compatibility Magazine 4, no. 3 (2015): 79–85. https://doi.org/10.1109/memc.2015.7336761.
J. A. Russer, N. Uddin, A. S. Awny, A. Thiede, and P. Russer, “Near-field measurement of stochastic electromagnetic fields,” IEEE Electromagnetic Compatibility Magazine, vol. 4, no. 3, pp. 79–85, 2015, doi: 10.1109/memc.2015.7336761.
Russer, Johannes A., et al. “Near-Field Measurement of Stochastic Electromagnetic Fields.” IEEE Electromagnetic Compatibility Magazine, vol. 4, no. 3, Institute of Electrical and Electronics Engineers (IEEE), 2015, pp. 79–85, doi:10.1109/memc.2015.7336761.

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