Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model
T. Meier, C. Wiebeler, M. Reichelt, in: 75. Annual Meeting of the DPG and Combined DPG Spring Meeting , 2011.
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Abstract
Optical two-dimensional Fourier transform spectroscopy has been used to study the properties of semiconductor nanostructures in four-wave-mixing like experiments. Applying a phenomenological level model, we numerically and analytically analyze the main features of excitonic and biexcitonic contributions in a semiconductor quantum well by solving the optical Bloch equations. The method is extended to three-dimensional Fourier transform spectroscopy to investigate a recent experiment.
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Proceedings Title
75. Annual meeting of the DPG and combined DPG Spring meeting
forms.conference.field.series_title_volume.label
Verhandlungen der Deutschen Physikalischen Gesellschaft
Volume
46
Issue
1
Conference
75. Annual meeting of the DPG and combined DPG Spring meeting
Conference Location
Dresden, Germany
Conference Date
2011-03-13 – 2011-03-18
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Meier T, Wiebeler C, Reichelt M. Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model. In: 75. Annual Meeting of the DPG and Combined DPG Spring Meeting . Vol 46. Verhandlungen der Deutschen Physikalischen Gesellschaft. ; 2011.
Meier, T., Wiebeler, C., & Reichelt, M. (2011). Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model. 75. Annual Meeting of the DPG and Combined DPG Spring Meeting , 46(1).
@inproceedings{Meier_Wiebeler_Reichelt_2011, series={Verhandlungen der Deutschen Physikalischen Gesellschaft}, title={Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model}, volume={46}, number={1}, booktitle={ 75. Annual meeting of the DPG and combined DPG Spring meeting }, author={Meier, Torsten and Wiebeler, Christian and Reichelt, Matthias}, year={2011}, collection={Verhandlungen der Deutschen Physikalischen Gesellschaft} }
Meier, Torsten, Christian Wiebeler, and Matthias Reichelt. “Analysis of Multidimensional Fourier Transform Spectroscopy for Semiconductors with a Phenomenological Level Model.” In 75. Annual Meeting of the DPG and Combined DPG Spring Meeting , Vol. 46. Verhandlungen Der Deutschen Physikalischen Gesellschaft, 2011.
T. Meier, C. Wiebeler, and M. Reichelt, “Analysis of multidimensional Fourier transform spectroscopy for semiconductors with a phenomenological level model,” in 75. Annual meeting of the DPG and combined DPG Spring meeting , Dresden, Germany, 2011, vol. 46, no. 1.
Meier, Torsten, et al. “Analysis of Multidimensional Fourier Transform Spectroscopy for Semiconductors with a Phenomenological Level Model.” 75. Annual Meeting of the DPG and Combined DPG Spring Meeting , vol. 46, no. 1, 2011.
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