Electrical trace analysis of superconducting nanowire photon-number-resolving detectors
T. Schapeler, N. Lamberty, T. Hummel, F. Schlue, M. Stefszky, B. Brecht, C. Silberhorn, T. Bartley, Physical Review Applied 22 (2024).
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Abstract
<jats:p>We apply principal component analysis (PCA) to a set of electrical output signals from a commercially available superconducting nanowire single-photon detector (SNSPD) to investigate their photon-number-resolving capability. We find that the rising edge as well as the amplitude of the electrical signal have the most dependence on photon number. Accurately measuring the rising edge while simultaneously measuring the voltage of the pulse amplitude maximizes the photon-number resolution of SNSPDs. Using an optimal basis of principal components, we show unambiguous discrimination between one- and two-photon events, as well as partial resolution up to five photons. This expands the use case of SNSPDs to photon-counting experiments, without the need of detector multiplexing architectures.</jats:p>
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<jats:copyright-statement>Published by the American Physical Society</jats:copyright-statement>
<jats:copyright-year>2024</jats:copyright-year>
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Publishing Year
Journal Title
Physical Review Applied
Volume
22
Issue
1
Article Number
014024
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Cite this
Schapeler T, Lamberty N, Hummel T, et al. Electrical trace analysis of superconducting nanowire photon-number-resolving detectors. Physical Review Applied. 2024;22(1). doi:10.1103/physrevapplied.22.014024
Schapeler, T., Lamberty, N., Hummel, T., Schlue, F., Stefszky, M., Brecht, B., Silberhorn, C., & Bartley, T. (2024). Electrical trace analysis of superconducting nanowire photon-number-resolving detectors. Physical Review Applied, 22(1), Article 014024. https://doi.org/10.1103/physrevapplied.22.014024
@article{Schapeler_Lamberty_Hummel_Schlue_Stefszky_Brecht_Silberhorn_Bartley_2024, title={Electrical trace analysis of superconducting nanowire photon-number-resolving detectors}, volume={22}, DOI={10.1103/physrevapplied.22.014024}, number={1014024}, journal={Physical Review Applied}, publisher={American Physical Society (APS)}, author={Schapeler, Timon and Lamberty, Niklas and Hummel, Thomas and Schlue, Fabian and Stefszky, Michael and Brecht, Benjamin and Silberhorn, Christine and Bartley, Tim}, year={2024} }
Schapeler, Timon, Niklas Lamberty, Thomas Hummel, Fabian Schlue, Michael Stefszky, Benjamin Brecht, Christine Silberhorn, and Tim Bartley. “Electrical Trace Analysis of Superconducting Nanowire Photon-Number-Resolving Detectors.” Physical Review Applied 22, no. 1 (2024). https://doi.org/10.1103/physrevapplied.22.014024.
T. Schapeler et al., “Electrical trace analysis of superconducting nanowire photon-number-resolving detectors,” Physical Review Applied, vol. 22, no. 1, Art. no. 014024, 2024, doi: 10.1103/physrevapplied.22.014024.
Schapeler, Timon, et al. “Electrical Trace Analysis of Superconducting Nanowire Photon-Number-Resolving Detectors.” Physical Review Applied, vol. 22, no. 1, 014024, American Physical Society (APS), 2024, doi:10.1103/physrevapplied.22.014024.
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