Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications
J. Maalouly, D. Hemker, S. Lange, M. Olbrich, C. Hedayat, J. Kutter, H. Mathis, in: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2024.
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Maalouly, Jad;
Hemker, Dennis;
Lange, Sven;
Olbrich, Marcel;
Hedayat, Christian;
Kutter, Jürgen;
Mathis, Harald
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2024 International Symposium on Electromagnetic Compatibility – EMC Europe
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Maalouly J, Hemker D, Lange S, et al. Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications. In: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe. IEEE; 2024. doi:10.1109/emceurope59828.2024.10722094
Maalouly, J., Hemker, D., Lange, S., Olbrich, M., Hedayat, C., Kutter, J., & Mathis, H. (2024). Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications. 2024 International Symposium on Electromagnetic Compatibility – EMC Europe. https://doi.org/10.1109/emceurope59828.2024.10722094
@inproceedings{Maalouly_Hemker_Lange_Olbrich_Hedayat_Kutter_Mathis_2024, title={Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications}, DOI={10.1109/emceurope59828.2024.10722094}, booktitle={2024 International Symposium on Electromagnetic Compatibility – EMC Europe}, publisher={IEEE}, author={Maalouly, Jad and Hemker, Dennis and Lange, Sven and Olbrich, Marcel and Hedayat, Christian and Kutter, Jürgen and Mathis, Harald}, year={2024} }
Maalouly, Jad, Dennis Hemker, Sven Lange, Marcel Olbrich, Christian Hedayat, Jürgen Kutter, and Harald Mathis. “Evaluation of Simulated and Real Measurement Data for AI-Based Interference Classification in EMC Applications.” In 2024 International Symposium on Electromagnetic Compatibility – EMC Europe. IEEE, 2024. https://doi.org/10.1109/emceurope59828.2024.10722094.
J. Maalouly et al., “Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications,” 2024, doi: 10.1109/emceurope59828.2024.10722094.
Maalouly, Jad, et al. “Evaluation of Simulated and Real Measurement Data for AI-Based Interference Classification in EMC Applications.” 2024 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2024, doi:10.1109/emceurope59828.2024.10722094.