Enhancing Information Extraction in EMC Measurements through Artificial Intelligence
M. Stiemer, S. Lange, D. Schröder, C. Hedayat, J. Maalouly, D. Hemker, H. Mathis, in: 2024 Smart Systems Integration Conference and Exhibition (SSI), IEEE, Hamburg, 2024.
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Conference Paper
| Published
| English
Author
Stiemer, Marcus;
Lange, SvenLibreCat 
;
Schröder, Dominik;
Hedayat, Christian;
Maalouly, Jad;
Hemker, Dennis;
Mathis, Harald
;
Schröder, Dominik;
Hedayat, Christian;
Maalouly, Jad;
Hemker, Dennis;
Mathis, HaraldDepartment
Publishing Year
Proceedings Title
2024 Smart Systems Integration Conference and Exhibition (SSI)
Conference
2024 Smart Systems Integration Conference and Exhibition (SSI)
Conference Location
Hamburg
Conference Date
2024-04-26 – 2024-04-28
LibreCat-ID
Cite this
Stiemer M, Lange S, Schröder D, et al. Enhancing Information Extraction in EMC Measurements through Artificial Intelligence. In: 2024 Smart Systems Integration Conference and Exhibition (SSI). IEEE; 2024. doi:10.1109/ssi63222.2024.10740546
Stiemer, M., Lange, S., Schröder, D., Hedayat, C., Maalouly, J., Hemker, D., & Mathis, H. (2024). Enhancing Information Extraction in EMC Measurements through Artificial Intelligence. 2024 Smart Systems Integration Conference and Exhibition (SSI). 2024 Smart Systems Integration Conference and Exhibition (SSI), Hamburg. https://doi.org/10.1109/ssi63222.2024.10740546
@inproceedings{Stiemer_Lange_Schröder_Hedayat_Maalouly_Hemker_Mathis_2024, place={Hamburg}, title={Enhancing Information Extraction in EMC Measurements through Artificial Intelligence}, DOI={10.1109/ssi63222.2024.10740546}, booktitle={2024 Smart Systems Integration Conference and Exhibition (SSI)}, publisher={IEEE}, author={Stiemer, Marcus and Lange, Sven and Schröder, Dominik and Hedayat, Christian and Maalouly, Jad and Hemker, Dennis and Mathis, Harald}, year={2024} }
Stiemer, Marcus, Sven Lange, Dominik Schröder, Christian Hedayat, Jad Maalouly, Dennis Hemker, and Harald Mathis. “Enhancing Information Extraction in EMC Measurements through Artificial Intelligence.” In 2024 Smart Systems Integration Conference and Exhibition (SSI). Hamburg: IEEE, 2024. https://doi.org/10.1109/ssi63222.2024.10740546.
M. Stiemer et al., “Enhancing Information Extraction in EMC Measurements through Artificial Intelligence,” presented at the 2024 Smart Systems Integration Conference and Exhibition (SSI), Hamburg, 2024, doi: 10.1109/ssi63222.2024.10740546.
Stiemer, Marcus, et al. “Enhancing Information Extraction in EMC Measurements through Artificial Intelligence.” 2024 Smart Systems Integration Conference and Exhibition (SSI), IEEE, 2024, doi:10.1109/ssi63222.2024.10740546.
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