An applied noise model for low-loss EELS maps
C. Zietlow, J. Lindner, Ultramicroscopy 270 (2025).
Journal Article
| Published
| English
Publishing Year
Journal Title
Ultramicroscopy
Volume
270
Article Number
114101
ISSN
LibreCat-ID
Cite this
Zietlow C, Lindner J. An applied noise model for low-loss EELS maps. Ultramicroscopy. 2025;270. doi:10.1016/j.ultramic.2024.114101
Zietlow, C., & Lindner, J. (2025). An applied noise model for low-loss EELS maps. Ultramicroscopy, 270, Article 114101. https://doi.org/10.1016/j.ultramic.2024.114101
@article{Zietlow_Lindner_2025, title={An applied noise model for low-loss EELS maps}, volume={270}, DOI={10.1016/j.ultramic.2024.114101}, number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Zietlow, Christian and Lindner, Jörg}, year={2025} }
Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss EELS Maps.” Ultramicroscopy 270 (2025). https://doi.org/10.1016/j.ultramic.2024.114101.
C. Zietlow and J. Lindner, “An applied noise model for low-loss EELS maps,” Ultramicroscopy, vol. 270, Art. no. 114101, 2025, doi: 10.1016/j.ultramic.2024.114101.
Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss EELS Maps.” Ultramicroscopy, vol. 270, 114101, Elsevier BV, 2025, doi:10.1016/j.ultramic.2024.114101.
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